FOSS invites you to join our technical seminar at Victam Asia: In-line Quality control – Get more out of your feed or flour production with ProFoss™ high resolution diode array in-line analysis Presentation of a new Near Infrared (NIR) in-line analyzer based on high resolution diode array technology. Full automated regulation of the process is achieved by interfacing the ProFoss™ solution to the existing process regulation system. Examples from installations together with actual results achieved will be presented. Presenter: Christian Tollebäck, Market manager, FOSS Analytical Please sign up to join a seminar from 1 – 1:30 pm at the Victam Asia show, March 3rd - 5th 2010, in Meeting Room 2 (directly across from the Plenary Hall).